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Allen-Bradley AB 1771-SDN Scanner Module, Advanced Industrial Automation Solution

The Allen-Bradley AB 1771-SDN Scanner Module is a high-performance device designed for advanced automation applications. It offers superior scanning capabilities with ladder-logic and structured-text programming, enabling efficient control and monitoring of industrial processes.

Model Type:Scanner Module

Manufacturer:Allen-Bradley

Model Number:1771-SDN

Series:Series D

Amperage Rating:Backplane: 5 VDC, 500 MA | DeviceNet: 24 VDC, 90 MA

Mounting:Chassis

Communication Speed:125 KBPS

Length:1-23/64 IN

Width:5-1/8 IN

Height:5-11/16 IN

Enclosure:Open Type

RFI Suppression:Radiated: 10 V/M With 1 KHZ Sine-Wave 80% AM From 80 – 2000 MHZ | Conducted: 10 VRMS With 1 KHZ Sine-Wave 80% AM From 150 KHZ – 80 MHZ

Temperature Rating:32 – 140 DEG F

Environmental Conditions:Relative Humidity: 5 – 95%

    The Allen-Bradley AB 1771-SDN Scanner Module is a versatile component designed for seamless integration into industrial automation systems. It excels in providing real-time data acquisition, crucial for enhancing operational efficiency.

    With its ladder-logic and structured-text programming capabilities, this scanner module offers advanced instruction sets including file handling, sequencer, diagnostic, shift register, immediate I/O, and program control instructions, catering to complex automation needs.

    Equipped with multiple main control programs, it allows for the segregation of control tasks, ensuring that different processes can operate concurrently without interference, leading to increased productivity.

    Processor input interrupts and global status flags are integrated for enhanced monitoring and control, enabling quick responses to system changes or faults before they impact operations significantly.

    The programmable fault response feature ensures that the system can react promptly to faults, preventing unnecessary downtime and minimizing potential losses. Additionally, the timed interrupt routine facilitates the examination of specific information at predefined intervals, optimizing data collection and processing.

AB 1771-SDN SCANNER MODULE




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